The research results of SHIGEKAWA Project for Extreme Quantum Metrology was published in a press release. Scientists at the University of Tsukuba combine scanning tunneling microscopy with ultrafast spectroscopy to image the motion of electrons with unprecedented resolution, which may lead to advances in semiconductors and optoelectronics Tsukuba, Japan – A team of researchers from the Faculty of Pure and Applied Sciences at the University of Tsukuba filmed the ultrafast motion of electrons with sub-nanoscale spatial resolution. This work provides a powerful tool for studying the operation of semiconductor devices, which can lead to more efficient electronic devices. The ability to construct ever smaller and faster smartphones and computer chips depends […]

Faculty of Pure and Applied Sciences, R&D Center for Innovative Material Characterization, University of Tsukuba invites applicants for two assistant professors or associate professors in the following research area. (1) Research related to surface science in electron emission, ultra-high vacuum, and discharge aiming at the next-generation electron microscope (2) Research related to electron optics, electron beam measurement, evaluation, and control technology aiming at the next-generation electron microscope The successful candidate will carry out the research and education in cooperation with faculty members who belong to Hitachi High-Tech Advanced SEM Technology Special Joint Research Project, Department of Applied Physics. Applicants must have a Ph.D. or equivalent degree in a relevant field, […]

The devices managed by R&D Center for Innovative Material Characterization are now available as open facility devices. ・Ultra-High-Resolution Schottky Scanning Electron Microscope SU7000（Hitachi High-Technologies） ・Tabletop MicroscopesTM4000Plus （Hitachi High-Technologies） ・CD-SEM – Advanced CD Measurement SEM CS4800（Hitachi High-Technologies） ・JIB-4000 Focused Ion Beam Milling & Imaging System（JEOL） Open facility device new registration SU7000From July 1, it has become available as an open facility device (R&D Center for Innovative Material Characterization shared use equipment). SU7000 is a high-performance, high-resolution scanning electron microscope.An electron optics / detection system designed to simultaneously acquire multiple secondary electron signals and backscattered electron signals enables quick acquisition of a wide variety of signals from a wide-field entire image to a […]

Hitachi High-Tech Co., Ltd. provides scholarships for the purpose of developing human resources by offering financial assistance to excellent students who are engaged in electron microscope development research and earnestly study hard. Collaborative Research Project for Advanced SEM Technology by Hitachi High-Tech in conjunction with the University of Tsukuba Application guidelines & forms (in Japanese) 1. Application guidelines 2. Application form 3. Research plan 4. A letter of recommendation